Using a gem garnet (GA1) as a possible reference material for in situ microanalysis of garnet
Kenshi Suga, Takafumi Hirata, Mayuko Fukuyama, Masatsugu Ogasawara
Geochemical Journal, Vol. 49, No. 4, P. 421-424, 2015
ABSTRACT
A gem garnet, GA1, from Sri Lanka obtained through a gem market was characterized for major and trace element compositions using LA-ICP-MS with a laser spot of 35 μm. Analytical results show that a negative correlation on a logarithmic scale exists between the relative standard deviation and the concentration for elements ≤1500 ppm, suggesting that the difference in the scatter of apparent element concentrations is not due to chemical heterogeneity but due to analytical uncertainty. The GA1 is homogeneous, except for V. We concluded that the elemental abundances obtained for the GA1 can be considered as reference values during in situ microanalysis of garnet. Fragments of GA1 are distributed to interested laboratories under the distribution policy in this paper.
KEYWORDS
gem garnet, reference material, trace elements, LA-ICP-MS, GA1
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